Hrishikesh Bale is a Solutions Manager of Engineering Materials at Carl Zeiss Microscopy. He specializes in new applications development for laboratory 3D X-ray imaging techniques both at micro and nano-scale. His research focus lies in the area of and in-situ micro and nano-mechanical testing using x-ray computed tomography. He has a background in mechanical engineering and materials science, with over a decade of experience in synchrotron X-ray microscopy and tomography, and finds great interest in pushing the forefront of in-situ imaging under extreme service conditions and developing multi-modal nano and micro 3D imaging solutions. Before joining Carl Zeiss Microscopy in 2014, he received his Ph.D. from Oklahoma State University and worked as a post-doc at Lawrence Berkeley National Laboratory.
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